EddyCus® TF lab devices are sheet resistance and thickness measuring desktop systems designed for quick non-contact thin film characterization in laborato-ries, R&D centers, and quality assurance departments in factories and labs. The system is equipped with an easy to use software for the measurement of thin-film thickness, wall thickness and sheet resistivity measurements.
• Sheet resistance range: 0.001 to 1000 Ohm/sq (others on request)
• Thickness measurement of thin films (e.g. copper) - 1nm to 500 µm (in accordance with sheet resistance)
• Sheet resistance/resistivity testing for the as-sess-ment of deposition processes, annealing processes, doping processes, ablation processes, or oxidation processes (aging)
• Thickness testing of metal films