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Non-Contact Sheet Resistance and Layer Thickness Measurement Device/EddyCus® TF lab 2020/4040

Non-Contact Sheet Resistance and Layer Thickness Measurement Device/EddyCus® TF lab 2020

EddyCus® TF lab devices are sheet resistance and thickness measuring desktop systems designed for quick non-contact thin film characterization in laborato-ries, R&D centers, and quality assurance departments in factories and labs. The system is equipped with an easy to use software for the measurement of thin-film thickness, wall thickness and sheet resistivity measurements.


• Sheet resistance range: 0.001 to 1000 Ohm/sq (others on request)
• Thickness measurement of thin films (e.g. copper) - 1nm to 500 µm (in accordance with sheet resistance)


Testing Applications
• Sheet resistance/resistivity testing for the as-sess-ment of deposition processes, annealing processes, doping processes, ablation processes, or oxidation processes (aging)
• Thickness testing of metal films



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